Atomic Force Microscope is a powerful and versatile microscope used in nanoscience and nanotechnology to study and manipulate matter at the atomic and molecular scale. It features an integrated design that combines the scan head and sample stage, ensuring robust anti-vibration performance. The scan resolution of the X and Y axis is 0.2nm while the Z axis comprises 0.05 nm offering exceptional resolution, precision, and the ability to study a wide range of physical and chemical interactions.