Outlier Detection for Quality Improvement in Semiconductor Testing
                     OUTLIER DETECTION FOR 
QUALITY IMPROVEMENT IN 
SEMICONDUCTOR TESTING
Semiconductor Testing
OUTLIER DETECTION
OUTLIER DETECTION
• In the highly competitive semiconductor industry, ensuring high-
quality products is crucial to maintaining customer satisfaction and 
gaining a competitive edge. Outlier detection is a powerful tool that 
can be used to identify and address issues with product quality. 
yieldWerx yield management system provides advanced outlier 
detection capabilities using wafer maps, stacked wafer map analysis, 
and die genealogy data.
OUTLIER DETECTION USING WAFER MAPS
• Wafer maps provide a visual representation of the location of 
failures on a wafer. yieldWerx uses advanced analytics algorithms to 
analyze wafer maps and identify outliers that may indicate 
systematic errors in the manufacturing process. By identifying the 
root cause of failures, manufacturers can take targeted actions to 
improve product quality and yield.
STACKED WAFER MAP ANALYSIS
• Stacked wafer map analysis is a technique used to identify hotspots 
and patterns of failing die across multiple wafers. This method 
involves aligning multiple wafer maps and stacking them on top of 
each other to identify common patterns or clusters of failing die. 
yieldWerx uses advanced algorithms to identify the causes of 
hotspots and patterns of failures and provides valuable insights into 
the semiconductor manufacturing process.
DIE GENEALOGY DATA 
• Die genealogy data includes information about pass and fail 
outcomes, parametric data, and wafer and lot identification. 
yieldWerx uses die genealogy data to trace the genealogy of each die 
and identify any patterns or trends that may indicate issues with the 
manufacturing process. By analyzing die genealogy data, 
manufacturers can gain valuable insights into the causes of failures 
and take appropriate actions to address them.
CONCLUSION
• In conclusion, outlier detection using wafer maps, stacked wafer map 
analysis, and die genealogy data is an essential tool for semiconductor 
manufacturers to improve quality and yield. yieldWerx provides 
advanced analytics and visualization tools to help manufacturers 
identify and address issues with product quality. By using yieldWerx, 
manufacturers can gain valuable insights into the manufacturing 
process and take precise actions to improve product quality and yield.
ADD ONS
• Automated Assemble Map Generation
• Quality Assurance & Risk Elimination
• Cross Work Center Correlation
• External Data Source Integration
• Real time Lot Control and Disposition
• Executive Dashboard
• Part Average Testing
CONT’D
• Smart Wafer Merge
• SPC/SBL/SYL
• Automated Data Loading
• Production Yield Reporting
• Raw Data Monitoring
• Standard Data Access
• Yield Calculation Flexibility
• Lot Genealogy