kelvin probe- Equiptest.com
                     A Comprehensive Guide to Kelvin Probe 
Technique by Equiptest.com 
 
 
 
Kelvin probe techniques are used to measure the work functions of materials. They have been 
successfully applied in surface science for decades, usually under UHV conditions. It is 
employed to study the adsorption of molecule surfaces or reconstruction processes of single-
crystal surfaces. Both of which cause a change in the surface or dipole potential. 
What is the Kelvin probe technique? 
The Kelvin Probe technique is a non-contact, non-destructive method that measures the change 
in the contact potential difference (CPD) between the sample and the electrode using a vibrating 
reference electrode. 
 
The work function difference between the tip and sample is produced using the conventional 
Kelvin probe. Lord Kelvin, a renowned Scottish scientist, proposed the Kelvin method in 1861. 
Typically, the tip is calibrated against a reference surface, such as gold. However, KP 
Technology is the only company that offers absolute Kelvin probes. To generate absolute work 
function values, this combines the Einstein Photoelectric Effect with the Kelvin technique (in 
eV). 
Specifications of Kelvin probe 
Because the topmost 1 - 3 layers of atoms or molecules define the WF of a surface, the Kelvin 
probe is one of the most sensitive surface analysis techniques available. KP Technology systems 
have an extremely high wf resolution of 1 - 3 meV. This is currently the highest achieved by any 
commercial device. 
 
It does not make physical contact with the surface.  Instead, an electrical connection is made to 
another part of the sample or sample holder. 
A head unit with a voice coil driving system and an inbuilt amplifier suspended above a sample 
is the physical form of a Kelvin Probe. 
 
 
The sample and the vibrating tip combine to create a capacitor with a perfect, or parallel-plate 
shape. Electric charge is pushed around the external detecting circuit as the tip vibrates. Both the 
potential across the capacitor and the capacitor spacing can be determined to very high 
resolution. It can be done by carefully controlling the tip potential and automatically capturing 
and analyzing the resulting waveform. 
Kelvin probes for Semiconductor surfaces 
The Kelvin probe is the only method for accurately measuring the Fermi level on semiconductor 
surfaces, including organic (polymer) and inorganic (Si, Ge, CdS, etc.) semiconductor surfaces. 
White or monochromatic light illumination alters the Fermi level, causing energy band shifts that 
can be utilized to describe the interface and bulk defect states. These processes are known as 
Surface Photovoltage (SPV) and Surface Photovoltage Spectroscopy (SPS).  KP Technology can 
provide our systems with the necessary software and add-ons. 
Equip-Test- Ultimate destination for all interface solutions 
Equip-Test is a worldwide manufacturer of test probes and fixture kits for a variety of 
applications. Our primary product line consists of test probes, test fixture kits, customized ICT, 
functional test fixtures, and integrated ICT with function testing capabilities. We make 
significant investments in research and development, internal laboratories, and high-tech 
manufacturing plants. If you have any concerns, our knowledgeable staff will be happy to assist 
you. Visit our official website today if you are looking for interface solutions or probe test tools. 
You can also get a quote by calling +36-29/550-940. 
 
 
 
 
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